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Brand: SainSmart

[Discontinued] SainSmart SM-328 Transistor Tester Capacitor ESR Inductance Resistor Meter LCR NPN PNP MOS

[Discontinued] SainSmart SM-328 Transistor Tester Capacitor ESR Inductance Resistor Meter LCR NPN PNP MOS

SKU:  101-10-110
Regular price $25.00
-Liquid error (snippets/price line 160): divided by 0 Regular price Sale price $25.00
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  • 101-10-110
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Specifications:

  • Standard configuration for the host + test hook + locking type line / SMD test seat
  • Dimensions: 90 * 58 * 23 (mm)
  • Weight (including attachments): less than 200 grams

Note:
Before measuring capacitance, the capacitor must be discharged, otherwise very likely damage the instrument.

Features:

  • One button operation, automatic shutdown, shutdown current is only about 20nA.
  • Can automatically detect NPN, PNP bipolar transistors, N-channel and P-channel MOS FET, JFET, diodes, two diodes, low power unidirectional and bidirectional thyristor thyristor.
  • Automatic identification pin arrangement of components, measuring current amplification factor of the bipolar transistor and the base - emitter threshold voltage.
  • Protection diodes can detect bipolar transistors and MOS tube, measuring MOS FET gate threshold voltage and gate capacitance.
  • It can simultaneously measure two resistors and resistor symbol is displayed. Show 4 decimal values in the right.
  • Resistance Symbol side shows the pin number. So you can measure the potentiometer. If the potentiometer wiper not be transferred to a certain extreme position, you can distinguish the middle and both ends of the pins.
  • Resistance measurement resolution is 0.1 ohms, 50M ohms can be measured.
  • Two diodes may be displayed in the correct order and a diode symbol, and gives diode forward voltage.
  • LED is detected as a diode, its forward voltage higher. Combo LED is recognized as two diodes. Reverse breakdown voltage is lower than 4.5V Zener diode can be identified.
  • Measurement results show that only a single element.
  • Measurement time is about 2S, just longer time measuring capacitance and inductance.